William R. Eisenstadt

Associate Professor, Ph.D.,  Stanford  University, 1986

Contents

Contact Information and Research

Department of Electrical and Computer Engineering
529  NEB
Universityof  Florida
P. O. Box 116130
Gainesville , FL32611-6130
Phone: 352.392.4946
Fax: 352.392.8381
wre@tec.ufl.edu 

Current Research

I am actively conducting research in the areas of embedded test of mixed-signal/RF circuits and RF BIST, high -speed I/O and I/O test,  RF power amplifiers, IC interconnect, and mixed-mode s-parameters. 


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NSF Research Information

Abstract:

The major activities of this project focus on developing and testing analog microwave IC test circuits that implement an "alternative test"-based RF/microwave built-in self test, (BIST) methodology. The overall project is part of a larger effort multi-university NSF ITR program including researchers from Georgia Tech, University of Texas at Austin, and Auburn University. These researchers are committed to developing low cost "alternative test" techniques to drastically lower the cost of mixed-signal/RF IC production test.

NSF Research Page

This material (in the paragraph and in the web page above) is based upon work supported by  the National Science Foundation under Grant No. 0325340. Any opinions, findings, conclusions or recommendations expressed in the material are those of the author (William R. Eisenstadt) and do not necessarily reflect the view of the National Science Foundation. 
 

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HIgh Speed I/O BIST Research

Prof. Eisenstadt and Prof. Fox are investigating methods of measuring jitter on-chip for high-speed I/O built-in self test. The link below is for collaborating university and company researchers.
 

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  Current  Research Projects

W. R. Eisenstadt C2S2 SRC MARCO Focus Center for Circuits and System Solutions, sponsored by NSF/Darpa through Carnegie Mellon University,

W. R. Eisenstadt, Wireless LAN Power Amplifier/Differental Load Pull and PA Test, sponsored by Globespan Virata/Conexant 

W.R. Eisenstadt and R. M. Fox, High Speed I/0 BIST, sponsored by the  Semiconductor Research Corporation.

W. R. Eisenstadt,  NSF ITR: Built-In Test of High Speed/RF Mixed Signal Electronics, sponsored by the National Science Foundation
 

W. R. Eisenstadt (PI) and R. M.  Fox (Co-PI), Embedded Test for Mixed-Signal/RF ICs, sponsored by Semiconductor Research Corporation.
W. R. Eisenstadt, Embedded Test of RF Receivers, sponsored by Motorola Inc.


. M. Fox (PI) and W. R Eisenstadt (Co-PI), Design of CMOS RF and Analog Circuits for a 5.8 GHz Transceiver, sponsored by Intersil Corp


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 Recent Patents and Publications

2004

W. R. Eisenstadt,  "RF Characterization Methods for High-Speed Devices and Interconnect," SEMICON Korea 2004 STS, (Largest Annual Korean Technical Conference), Seoul, Korea, Feb. 18, 2004.

 W. R. Eisenstadt and R. M. Fox, "RF/Microwave Embedded Test Circuits and Measurements,"  3rd  Workshop on Test of Wireless Circuits and Systems, Fort Worth, TX, June 6, 2004.

 Q. Yin, W. R. Eisenstadt and R. M. Fox, "A Translinear-Based RF RMS Detector for Embedded Test,"  ISCAS 2004, Vancouver, Canada, May 23-26, 2004.

 T. Zhang, W. R. Eisenstadt and R. M. Fox, "A Novel 5GHz RF Power Detector," ISCAS 2004, Vancouver, Canada, May 23-26, 2004.

J. Yoon, and W. R. Eisenstadt, "Lumped Passive Circuits for 5GHz Embedded Test of RF SoCs," ISCAS 2004, Vancouver, Canada, May 23-26, 2004.

W. R. Eisenstadt, R. M. Fox, S. Choi, M. He, Q. Yin, J. Yoon, and T. Zhang, "On-chip RF Measurement Circuits," VLSI Test Symposium 2004, Session 6C.1, Napa, CA, April 27, 2004.

W.R. Eisenstadt, "C2S2 Research in Mixed-Signal/RF Test," accepted to MARCO/SRC Joint Workshop on Mixed-Signal, RF and Multi-GigaHertz Test, April 25, 2004.

S. Shin, Y. Eo, W. R. Eisenstadt and J. Shim, "Analytical Models and Algorithms for the Efficient Signal Integrity Verification of Inductance-Dominant Multi-Coupled VLSI Interconnects,"  IEEE-Trans. on VLSI, Vol. 12, No. 4, , pp. 395-407, April 2004.

R. M. Fox, H. J. Ko, and W. R. Eisenstadt, "Differential Log-Domain Filters with High-Gain Common-Mode Feedback," IEEE Trans. on Cir. and Sys., Part 1, Vol.:51, No. 2, , pp 254-263, Feb. 2004.

W. R. Eisenstadt, "Invited Tutorial: Embedded Test of RF/Microwave," DATE 2004, W3 RF/Multi-GigaHertz Test Workshop, Paris, France, Feb 20, 2004.

W. R. Eisenstadt,  "RF Characterization Methods for High-Speed Devices and Interconnect," SEMICON Korea 2004 STS, (Largest Annual Korean Technical Conference), Seoul, Korea, Feb. 18, 2004.

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2003

K. Jung and W. R. Eisenstadt, "SPICE-Based Mixed-Mode S-Parameter Calculations for Four Port Circuits," 62nd ARFTG Microwave Measurement Conference, Boulder Co, Dec. 2-5, 2003, 4 pages.

A. Nadeem and W. R. Eisenstadt, "Improved Closed-Form Expressions for S-Parameters of BJTs Using Modified Gummel-Poon Model," accepted to IEEE International Multi Topic Conference  (INMIC2003) Islamabad, Pakistan, Dec. 8-9, 2003.

Y. Eo, W.R. Eisenstadt, W. Jin, J. Choi and J. Shim, "A Compact Multi-Layer IC Package Model for Efficient Stimulation, Analysis, and Design of High-Performance VLSI Circuits,"  IEEE Trans. (CPMT Part B) on Adv. Pack. Vol. 25, No. 4, pp. 392-401, Nov. 2003.

A. Nadeem and W. R. Eisenstadt, "Design & Development of Lossless Transmission Lines," 2nd International Bhurban Conference on Applied Sciences and Technology, IBCAST, Bhurban, Pakistan, June 16-21, 2003, 8 pages.

W. R .Eisenstadt, "Mixed-Mode S-Parameter Theory," IEEE MTT-S 2003 Microwave Symposium Workshop: Multiport/Multimode Measurements & Related Applications, Philadelphia, PA, June 9, 2003.

S. Choi, W. Eisenstadt and R. Fox, "Design of Programmable Embedded IF Source for Design for Test," ISCAS'2003, Bangkok, Thailand, Vol. 5. 25-28, May 2003, pp. V241-V244.

S. Shin, Y. Eo, W. R. Eisenstadt, and J. Shim, "Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching," ACM/IEEE International Workshop on Timing Issues, Feb 2-3, 2004.

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2002

 
Y. Eo, S. Shin, W. R. Eisenstadt and J. Shim, "Generalized Traveling-Wave-Based Waveform Approximation (TWA) Technique for the Efficient Signal Integrity Verification of Multi-Coupled Line System, IEEE Trans. on CAD., Vol. 21. No. 12, pp.1497. Dec. 2002.
 
A. E. Nadeem and W. R. Eisenstadt, "Design Oriented Analysis of Ambient Temperature Effects and Optimization of Common DC Bias Networks for RF/Microwave Circuits," 9th National Aeronautical Conference (NaeC, 2000), Risalpur, NWFP, Pakistan, Nov. 20-21, 2002, 10 pages.

W. R. Eisenstadt, C. Cho, R.  Stengel, and E. Ferrer, "Third-Order Intercept Point (IIP3) from Gain Compression Curve," Digest of  2st Workshop on Test of Wireless Circuits and Systems ,  Baltimore,  MD, October 10-11, 2002, 2 pages. 

 
 

J. R. Paviol, Y.-S. Ko, and W. R. Eisenstadt, "Automated Engineering WLAN PA Distortion Test," Digest of 2st Workshop on Test of Wireless Circuits and Systems, " Baltimore, MD ,  October 10-11, 2002 , 6 pages. 
 

R. M. Fox, R. Chawla, W. R. Eisenstadt, D. Hemmenway, and J. Johnson, "Circuit for Monitoring BJT RF Performance Using DC Measurements," IEEE JSSC. , vol. 37, no. 9, pp. 1207-1210, September 2002.


 

Y. Eo, J. Shim, and W. R. Eisenstadt, "A Traveling-Wave-Based Waveform Approximation Technique for the Timing Verification of Single Transmission Lines," IEEE Trans. on CAD, vol. 21, pp. 723-730, June 2002. 
 

W. R. Eisenstadt and S.  Choi, "Programmable Embedded IF Source For Wireless Test," Digest of VTS2002 IP Sesson 4: Wireless Test, Monterey , CA , April 28- May 3, 2002.

R. Chawla, W. R. Eisenstadt, R. M. Fox, D. Hemmemway,  J. Johnston and C. McCarty, "Semiconductor Test System And Associated Methods For Wafer Level Acceptance Testing," University of Florida Invention Disclosure UF#-10541 and Intersil Americas, Inc., Patent Application No. 60/282,011, Filed for US Patent April 6, 2002.
 

S. Shin, Y. Eo, W. R. Eisenstadt, and J. Shim, "Analytical Signal Integrity Verification Models for Inductance-Dominant Multi-Coupled VLSI Interconnects," Digest of SLIP 2002, San Diego ,  CA ,  Apr. 6-7, 2002 .
 
 

O. D. Crisalle, W. R. Eisenstadt, R. K.  Stanfill, and G. J. Weins, "Lessons Learned in Integrated Product and Process Design Education," Digest of ASEE-SE Section Annual Conference, Gainesville,  FL ,  Apr. 7-9, 2002.


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2001

 

 
 
 

W. R. Eisenstadt and S. Choi, "Programmable Embedded IF Source for Wireless Test," Digest of 1st Workshop on Test of Wireless Circuits and Systems,  Baltimore, MD,  November 1-2, 2001 , 8 pages.
 

R. M. Fox, R. Chawla, W. R. Eisenstadt, D. Hemmenway, andJ.  Johnson, "Circuit for Monitoring BJT RF Performance Using DC Measurements," Digest of Bipolar/BiCMOS Cir. And Tech  Meet., Minneapolis ,  MN ,  October 1-2, 2001 , pp. 139-142.
 

R. M. Fox, H. J.  Ko, and W. R. Eisenstadt, "Dynamic Current Requirements in Single-Ended Log-Domain Filters," Analog. ICs and Sig. Proc. Special Issue,  Kluwer, vol. 28, issue 3, pp. 73-81, July 2001.

W. Jin, Y. Eo, W. R. Eisenstadt, and J. Shim, "Fast and Accurate Quasi-Three-Dimensional Capacitance Determination of Multi-Layer VLSI Interconnects," Trans. on  VLSI Syst., vol. 9, no. 3, June 2001, pp. 450-460.


W. Jin, Y.  Eo, W. R. Eisenstadt, M. Park and H.Yu , "Silicon Substrate Coupling Noise Modeling, Analysis, and Experimental Verification for Mixed Signal Integrated Circuit  Design," Digestof IMS2001, Phoenix, AZ, May 20-25, 2001, vol. 3, pp. 1727-1730. 
 

R. M. Fox, H. J. Ko, and W. R. Eisenstadt, "A New Class of Log-Domain Filters Based on Common-Mode Feedback," Digest of ISCAS' 2001, Sydney , Australia , May 6-9, 2001, vol. 1, pp. 560-563. 

2000

D. E.  Bockelman, and W. R. Eisenstadt, "Direct Measurement of Crosstalk Between Integrated Differential Circuits," IEEE Trans. on MTT, vol. 48, no. 8, pp. 1410-1413, Aug. 2000.
Y.  Eo, W. R. Eisenstadt, and J. Shim, "S-Parameter-Measurement-Based High-Speed Signal Transient Characterization of VLSI Interconnects on SiO 2-Si Substrate," IEEE Trans. on Adv. Pack., vol. 23, no. 3, pp. 470-479, August 2000. 


 A.E.  Nadeem and W. R. Eisenstadt, "Insightful Closed-Form Expressions for Small-Signal S-Parameters of BJTs," Digest of World Sci.  Eng. Soc. (WSES) 4th World Con.On Cir. Sys. Com. And Comp. CSCC-2000,  Athens,  Greece , July 10-15, 2000.
 

Y.  Eo, W. R. Eisenstadt, J. Y. Jeong , and O-K. Kwon, "New Simultaneous Switching Noise Analysis and Modeling for High-Speed and High-Density CMOS IC Package Design," IEEE Trans. on Adv. Pack., vol. 23 no-2, pp. 303-312, May 2000. 
 
 

S.  Srivastiva, D. Kumar and R. K. Singh, H.  Venkataraman and W. R. Eisenstadt, "Improvement in Electrical and Dielectric Behavior of (Ba,  Sr) TiO3 Thin Films by Ag Doping," Phys. Rev. B, vol. 23 no. 11, pp. 7305-7307, March 15, 2000. 
 
 

B. Stengel and W. R. Eisenstadt, "LINC Power Amplifier Combiner and Efficiency Optimization," IEEE Trans. on Veh. Tech., vol. 49, no. 1, pp. 229-234, January 2000. 
 

Y.  Eo, W. R. Eisenstadt, J. Y. Jeong , and O.-K. Kwon, "A New On-Chip Interconnect Crosstalk Model and Experimental Verification for CMOS VLSI Circuit Design," IEEE Trans. on Elect. Dev. , vol. 47, no. 1, pp. 129-140, January 2000. 
 

 
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SRC Member Company, Faculty and Student Link

This link is for research exchange between SRC member company engineers and scientists, University Faculty and University Students.
 

Biographical Information

Starting with his Ph.D. work Prof. Eisenstadt has more than 20 years experience in developing microwave test and performing analog and RF/microwave IC design. He has strong expertise in the use of s-parameter equipment (HP 8510, Cascade probes), Load-pull equipment (Maury Microwave), high-speed sampling oscilloscope measurements, integrated picosecond photoconductor-based sampling systems and RF and microwave embedded test elements for production IC test. Eisenstadt and Bockelman developed mixed-mode s-parameters (differential and common-mode) for characterization of differential IC designs (7 papers, 3 patents).  Eisenstadt and Eo developed measurement-based extraction of microwave IC interconnect parameters and continue to publish in the field (~20 papers). Currently, Eisenstadt is leading research in embedding RF tests in the IC to reduce production and manufacturing test costs. In this work, he leads the development of compact structures that source and detect RF/microwave and signals on the IC.
Prof. Eisenstadt has published over 90 journal articles and conference papers and 6 patents. In 1985 he was awarded the NSF Presidential Young Investigator Award.  He  is Technical Program Chair of the  64th  ARFTG Microwave Measurement Conference in Orlando, FL , Dec. 2004 and is  on the Program Committee of the Wireless Test Workshop and the ISCAS, Analog Signal Processing Technical Committee, ASTPC, 2003 to present.
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Last revised:  7/6/04